Dr. Jan Schmalhorst
The main goals of our work are the basic understanding of magnetism and spin dependent electronic transport in thin films and nanostructures and the development of optimized magneto- and spinelectronic devices. A profound characterization of physical properties of the samples is required to achieve this. Especially the structural and electronic properties of the key components have to be determined. These components are magnetic thin films, ultra thin insulators and the interfaces between them.
My research field includes thin film deposition with or without in-situ characterization, transport measurements, the investigation of the structure by X-ray diffraction and Auger electron spectroscopy based depth profiling, direct measurements of the electronic properties by X-ray photoelectron spectroscopy and the measurement of element specific magnetic and electronic bulk and interface properties utilizing X-ray absorption spectroscopy (XAS), X-ray magnetic circular dicoism (XMCD), X-ray magnetic linear dicroism (XMLD) and other state-of-the-art synchrotron-based techniques.
Please send general emails to Jan Schmalhorst (firstname.lastname@example.org).