Dr. Jan Schmalhorst
The main goals of our work are the basic understanding of magnetism and spin dependent electronic transport in thin films and
nanostructures and the development of optimized magneto- and spinelectronic devices. A profound characterization of physical
properties of the samples is required to achieve this. Especially the structural and electronic properties of the key components
have to be determined. These components are magnetic thin films, ultra thin insulators and the interfaces between them.
My research field includes thin film deposition with or without in-situ characterization, transport measurements, the investigation of the structure by X-ray diffraction and Auger electron spectroscopy based depth profiling, direct measurements of the electronic properties by X-ray photoelectron spectroscopy and the measurement of element specific magnetic and electronic bulk and interface properties utilizing X-ray absorption spectroscopy (XAS), X-ray magnetic circular dicoism (XMCD), X-ray magnetic linear dicroism (XMLD) and other state-of-the-art synchrotron-based techniques.
Please send general emails to Jan Schmalhorst (jan.schmalhorst@uni-bielefeld.de).
Dr. Jan Schmalhorst studied physics at Bielefeld University. Before he has come back to university in 1998, he worked for a surface science company.
Currently, he is a senior scientist in the "Thin films and Physics of Nanostructures" group at Bielefeld University, his main area of research is the characterization
of magnetic thin-films by synchrotron-based techniques. He was dean of students from October 2006 through July 2009 and
has been the organizer of the Herbstakademie Physik since 2005.
Furthermore he is the coordinator
of the Department of Physics for the refurbishment of the University main building, the building X
and the new laboratory building Experimental Physics (XPhy).