The main goals of our work are the basic understanding of magnetism and spin dependent electronic transport in thin films and naostructures, the development of optimized magneto- and spinelectronic devices and new methods for the creation of magnetic nano patterns.
A profound characterization of physical properties of the samples is required to achieve this. Especially the structural and electronic properties of the key components have to be determined. These components are: magnetic thin films, ultra thin insulators and the interfaces between them.
My research field includes transport measurements, e.g., temperature and magnetic field dependent current-voltage characteristics and dielectric stressing. I investigate the structure by X-ray diffraction and Auger electron spectroscopy based depth profiling, direct measurements of the electronic properties by X-ray photoelectron spectroscopy and, notably, the measurement of element specific magnetic and electronic bulk and interface properties utilizing X-ray absorption spectroscopy including X-ray magnetic circular and linear dicroism.
Please send general emails to Jan Schmalhorst (firstname.lastname@example.org).