Physik supramolekularer Systeme und Oberflächen

 
 
Hintergrundbild
Hintergrundbild
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Laboratory for Preparation and Characterization of Nanostructures

Spectroscopy

XPS (X-Ray Photoelectron Spectroscopy)
UPS (Ultraviolet Photoelectron Spectroscopy)
AES (Auger Electron Spectroscopy)
ISS (Ion Scattering Spectroscopy)
Depth profiling (ARXPS, sputtering)

Microscopy

SEM (Scanning Electron Microscopy)
SAM (Scanning Auger Microscopy)
STM (Scanning Tunneling Microscopy)

Preparation

PVD (Physical Vapor Deposition)
CVD (Chemical Vapor Deposition)
Low Energy Electron Irradiation
Sample heating/cooling
Sputtering

Cleanroom

Whiteroom (Class 1000)

Wetbench
Optical Microscopes
Spin Coater
Photolithography

Greyroom

Optical Microscopes
Critical Point Dryer
Ozone Cleaner
Contact Angle Measurement System

Helium Ion Microscope

He-Ionen Mikroskop

Helium Ion Microscope Orion from Zeiss
ELPHY MultiBeam Pattern Generator from Raith (link to product)

LEEPS Microscopes

Low Energy Electron Point Source (LEEPS) microscope
Nanomanipulator
Single nanowire experiments



Low Energy Electron Point Source (LEEPS) microscope
High resolution detector
Electron Holography

Scanning Probe Microscope

AFM (Atomic Force Microscopy)
STM (Scanning Tunneling Microscopy)
Electrochemistry

Infrared Spectroscopy

IRRAS (Infrared Reflection Absorption Spectroscopy)
ATR-IR (Attenuated Total Reflection Spectroscopy)

Projection Lithography

Low Energy Electron Irradiation

Ionbeam

Ion-Source (15kV)
Duo-Plasmatron Ion-Source (30kV)
Space-/Timeresolved Fragment-Spectrometer


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Labore

NameRaumTelefon
AFM und IR-SpektroskopieD0-25267040
Reinraum - grauD0-2552654
Reinraum - weißD0-2572655
Chemielabor IID0-267
Chemielabor ID0-210
Elektrische MessungenD0-2585358
LEEPS 1D0-2172436
LEEPS 2D0-2215371
PVD / CVD LaborD0-2075367/5368
NanostrukturlaborD02-225 D2633
Jeol REM / RohröfenD02-225 B2634
Helium Ionen MikroskopD02-225 A5342

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